Tomographic Method
Computed tomography utilizing a stationary or limited-angle rotation sequence provides three-dimensional imaging of flat electronic assemblies. While traditional computed tomography requires a full rotation of the sample, 3d planar ct reconstructs internal layers through high-resolution slices acquired at oblique angles.
Reconstructive Capability
Mathematical algorithms combine multiple two-dimensional x-ray views to synthesize a volumetric model of the target area. Depth resolution depends on the number of projections and the angular range covered by the sensor during the scan. Software processing isolates specific circuit layers to identify features that stay hidden in standard transmission x-rays.
Because the system focuses on a plane rather than a single point, 3d planar ct enables the inspection of large-format panels that cannot rotate within a standard x-ray cabinet. This method allows for the identification of defects in layered substrates that would otherwise require destructive cross-sectioning.
Inspection Application
Surface mount components with hidden terminations or bottom-only connections are the primary subjects for this inspection. Quality engineers use 3d planar ct to verify the integrity of ball grid arrays and land grid arrays without damaging the board. Voids inside solder joints or misaligned internal traces appear clearly in the reconstructed slices.
Effective detection of barrel fill in through-holes requires the system to maintain a high signal-to-noise ratio during the image acquisition phase.
