Burn in Hours Charged against the Product Life Remaining
Accelerated burn in hours deduct directly from product life reserves based on activation energy kinetics and must be contractually capped to prevent premature field wear out.
Eyring Voltage Model
Physical Equation
Analytical framework used to quantify the combined effects of temperature and electrical potential on the degradation rate of insulating materials. Testing laboratories implement the eyring voltage model to predict how higher operating voltages will accelerate dielectric failure in capacitors and thin gate oxides. This model includes an extra term for voltage that traditional temperature only models miss.
Stress Interaction
Use of this formula enables engineers to design accelerated tests that use both voltage spikes and thermal soak to reduce total testing time. When the voltage exceeds nominal levels, it creates an electric field that lowers the potential barrier for chemical or physical changes. The model suggests that doubling the voltage can have a more severe impact on lifetime than a ten degree temperature increase in some materials.
Reliability experts solve the model parameters by comparing units run at standard voltage against those run at extremes.
Model Reliability
Data from the eyring voltage model determines safe operating margins for new power supply designs or high density circuit boards. It stops providing useful forecasts if the voltage is so high that instant breakdown occurs rather than gradual wear. Successful application relies on clear separation between steady state aging and catastrophic failure thresholds.