Preparation Protocol
Metallographic cross sectioning begins with extracting a small coupon from a printed circuit board assembly using a diamond saw to expose internal copper structures. Technicians mount this specimen in thermosetting epoxy resin to protect fragile barrel plating during subsequent grinding steps. Fine silicon carbide papers reduce the surface relief progressively before diamond slurries achieve a mirror polish.
Chemical etchants reveal grain boundaries and intermetallic compounds hidden beneath the polished metal surface.
Inspection Boundary
Optical microscopy evaluates internal layer registration, plating thickness and dielectric spacing after preparation concludes. Acceptance criteria demand that barrel copper plating satisfies minimum thickness thresholds specified by performance standards without exhibiting cracks or voids. Voids inside plated through holes or barrel anomalies disqualify the lot during receiving inspection because thermal stress testing will fracture thin copper walls.
Thermal shock exposure during soldering creates high shear forces on substandard barrels, making accurate optical analysis of wall thickness the primary defense against field failures.
Failure Analysis
Destructive metallographic evaluation reveals root causes of electrical intermittency by exposing cracked joints and contaminated interfaces. Voids in solder fillets and barrel fractures appear clearly under polarized light after polishing removes surface smearing caused by mechanical cutting. Analysis confirms whether defects originate from chemical bath imbalances during electroplating or excessive thermal exposure during reflow profiling.
Precise physical measurement of intermetallic layer thickness confirms proper diffusion bonding between copper and tin during the assembly process.