Mechanical Stress
Functional and in-circuit testing using bed-of-nails fixtures can introduce a mechanical stress that occurs when a printed circuit board bends under the pressure of a vacuum seal. This board deformation, known as vacuum drawdown flex, can crack fragile surface-mount components like multi-layer ceramic capacitors or solder joints under ball grid array packages. It is caused by an uneven distribution of support pins or excessive suction force applied to the board during test fixture activation.
Assembly shops must monitor this stress to prevent latent defects that survive the test but fail in the field.
Deformation Consequence
Measuring the extent of the board bend requires attaching strain gauges to the circuit board during test development. These gauges measure the microstrain experienced by the board during the vacuum drawdown flex and help engineers locate areas of high stress. Industry standards, such as IPC/JEDEC-9704, specify maximum strain limits that the board must not exceed during testing.
If the measured strain is too high, the fixture must be modified by adding more support pins or adjusting the vacuum pressure. This step is necessary for thin boards or assemblies with large, rigid components.
Control Methodology
Alternative mechanical actuation methods, like pneumatic presses, are sometimes used to avoid vacuum-related bending. These presses apply localized pressure only where probes are present.