Interface Integrity
Nondestructive inspection technology utilizes high frequency sound waves to detect internal delamination or voids within electronic packages. Precise c-mode acoustic microscopy scans a specific depth plane to produce a two dimensional image of the interface between materials. It identifies air gaps that optical or X ray methods might miss due to the high sensitivity of ultrasound to density changes at material boundaries.
Internal Defect
Signal reflections occur whenever the sound wave hits a transition between a solid and a gas. In the context of board assembly, c-mode acoustic microscopy exposes hidden cracks in flip chip underfill or moisture induced expansion in plastic ball grid arrays. The resulting image displays these defects as high contrast regions where the ultrasonic energy failed to pass through the part.
Failure Analysis
Identifying the depth of a defect allows engineers to distinguish between a die attach failure and a substrate fracture. During the scan, a transducer moves across the submerged sample while a gate captures reflections from a targeted temporal window. Accurate timing ensures the data originates from the exact layer of interest.
Results from this method provide the evidence needed to reject batches showing signs of resin recession. The scan provides a definitive view of the internal structural health of the component.