
High Aspect Ratio Blind via Reliability Limits under Sequential Thermal Cycling and Z-Axis Stress
High aspect ratio blind vias require low Z-CTE filled laminates and pulse plating to prevent target pad separation during lead-free thermal cycling.

High aspect ratio blind vias require low Z-CTE filled laminates and pulse plating to prevent target pad separation during lead-free thermal cycling.

Interconnect stress testing detects sub-micron post separations through dynamic resistance drift before static optical microsections show physical cracks.
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