Interface Reflection Coefficient ~ Area ~ Sourcing

A diode rests between metal plates and ceramic spacers within a multi layered fixture used for testing electronic component mechanical integrity.

C-SAM Inspection Ultrasonic Transducer Selection Pulse Echo Testing

Transducer Selection and Frequency Optimization for High Density Substrate Inspection

High frequency ultrasonic inspection demands matching transducer bandwidth and focal length to substrate layer depth to catch sub-micron microvia disbonding.

What the firm knows, published

Expertise is a utility, not a secret. sentiention™ publishes its working knowledge as open reference: intelligence layer covering the materials it sources, the markets it enters, and the reference that serves both.