Non-Contact Measurement
Measurement techniques utilizing the propagation of electromagnetic waves in free space allow for the characterization of materials at sub-terahertz frequencies. The application of quasi-optical metrology avoids the signal losses and parasitic effects associated with traditional cables and connectors. This method is essential for evaluating the dielectric properties of substrates where the wavelengths are too small for conventional probes.
Material Analysis
Reflection and transmission coefficients are recorded as a beam of radiation passes through a sample. Through quasi-optical metrology, researchers determine the permittivity and loss tangent of advanced packaging materials with high precision. This data is used to calibrate the simulation models used in the design of 6G communication hardware.
The setup often includes a vector network analyzer coupled with specialized horns and lenses to focus the energy.
Beam Management
Accuracy depends on the alignment of the Gaussian beam as it interacts with the material under test. If the sample is not perfectly flat, the resulting scattering can introduce errors into the quasi-optical metrology results. Mirrors and apertures are used to shape the wave and eliminate unwanted reflections from the laboratory environment.
This careful control ensures that the measured response is solely due to the material properties.
