Near-Field Mapping
Automated electromagnetic probe systems map localized electric and magnetic field distributions across the physical surface of operating printed circuit boards. Utilizing spatial near-field scanning pinpoints precise sources of unwanted electromagnetic emissions and noise coupling pathways at board level. Micro-coaxial magnetic loop or electric field probes sweep across circuit layouts at sub-millimeter offsets controlled by robotic gantries.
Phase and amplitude measurements map high-frequency noise currents flowing through ground planes, trace crossovers and integrated circuit pins. Spatial resolution depends on probe tip geometry and distance from the target conductor. High-resolution scans isolate high-frequency noise sources before far-field testing.
Interference Locating
Diagnostic scans convert surface field measurements into color-coded spatial maps displaying noise intensity overlays directly on board CAD layouts. Conducting spatial near-field scanning allows hardware engineers to locate switching power supply noise and unshielded clock lines before full compliance testing. Identifying localized field peaks guides targeted placement of decoupling capacitors or board-level shielding cans.
Radiated Diagnostic
Early near-field analysis reduces compliance re-testing cycles at far-field anechoic chamber facilities. Integrating spatial near-field scanning into early prototype debugging resolves root causes of electromagnetic interference without trial-and-error board re-layouts. Precise field mapping verifies the effectiveness of board layout grounding and filtering modifications.
