Assembly Escape Rate ~ Area ~ Sourcing

A specialized heavy duty vacuum chamber with metallic panels and thick grey conduits stands recessed within a concrete floor in an industrial production facility.

Continuous Resistance Monitoring Viscoelasticity Barrel Fatigue

High Temperature Viscoelastic Strain Relaxation Kinetics in Low Loss High Frequency Dielectric Microvia Stacks

High temperature viscoelastic relaxation in low-loss dielectrics shifts z-axis strains to microvias, causing interfacial target-pad tears caught only by in-situ testing.

Integrated circuit rests centered on clear plastic component trays beside a spool of solder and a small cardboard package at a workstation.

Boundary Cell Shift Guard Pin Layout Contact Resistance

Integrating Boundary Scan Vectors with Bed of Nails in Circuit Testing

Integrating boundary scan vectors into bed of nails fixtures closes non-access coverage gaps while reducing physical probe strain and assembly rework costs.

Assembly Escape Rate

High Temperature Viscoelastic Strain Relaxation Kinetics in Low Loss High Frequency Dielectric Microvia Stacks

Integrating Boundary Scan Vectors with Bed of Nails in Circuit Testing

What the firm knows, published