
Microvia Plating Fatigue under Thermal Cycling
Microvia plating fatigue under thermal cycling stems from z-axis CTE mismatch, requiring ductile copper plating and continuous resistance monitoring to prevent field failures.

Microvia plating fatigue under thermal cycling stems from z-axis CTE mismatch, requiring ductile copper plating and continuous resistance monitoring to prevent field failures.

Thermal cycles in high density stackups drive copper recrystallization, causing grain growth and vacancy coalescence that trigger microvia interface failures.
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