
Resolving Non Compliant Interconnect Escape Rates in Hybrid Boundary Scan in Circuit Testing
Resolving boundary scan escape rates requires weighting fault coverage by defect universe and enforcing active guarding on unprobed parallel nets.

Resolving boundary scan escape rates requires weighting fault coverage by defect universe and enforcing active guarding on unprobed parallel nets.

Combining boundary scan and in-circuit testing metrics requires mapping per-pin PCOLA-SOPS access, deduplicating overlapping faults, and logging verified nets for batch release.

Boundary scan interconnect testing turns silicon multiplexers into virtual probes to verify fine-pitch BGA solder joints without physical test pads.
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