Quasi-Optical Transmission Loss Extraction for High-Frequency Stackup Design
Quasi-optical extraction isolates intrinsic substrate loss from copper roughness, requiring explicit z-axis anisotropy conversion for accurate mmWave stackup design.
Empirical Reconciliations between Peripheral Test Coupons and High Density Multilayer Circuitry
Reconciling edge coupon TDR and plating data with interior HDI circuitry demands empirical compensation factors for electroplating current and etch rates.
Buildup HDI Stackup Design and Layer Thickness Control
Stackup thickness control requires calculating pressed prepreg heights over local copper patterns to hold impedance and microvia drilling tolerances.
Selecting Dielectric Substrates for High Speed Multilayer Stackup Design
Selecting dielectric substrates requires balancing dissipation factor, glass weave uniformity, foil roughness, and panel yields to meet high-speed impedance targets.