
In-Situ Free-Space Dielectric Testing of Unclad Substrates
Non-destructive free-space characterization evaluates bulk dielectric properties of raw unclad laminates without etched coupon waste or copper interface errors.

Non-destructive free-space characterization evaluates bulk dielectric properties of raw unclad laminates without etched coupon waste or copper interface errors.

Matching glass bundle pitch to trace geometry and using spread glass weaves eliminates local permittivity variations, bounding differential phase skew within tolerance.

Dynamic top-to-bottom spray pressure balancing and zonal CAM compensation eliminate conveyor puddle variations to hold tight high-frequency trace impedance.

Frequency-domain tensor extraction decouples directional permittivity and loss tangent variations on glass core build-up panels, fixing impedance tolerances across sub-THz interconnects.

Dynamic lamination rheology control via 2.0-2.8°C/min platen ramp rates minimizes glass bundle tilt and resin squeeze-out to hold sub-picosecond phase skew.
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