Clamped Stripline Resonator Method for High Frequency Dielectric Characterization
Clamped stripline resonators extract out-of-plane permittivity and loss tangent up to 10 GHz by measuring resonant modes of unclad dielectric sheets under pressure.
Substrate Copper Roughness Impacts on High Frequency Cavity Performance
Copper surface roughness increases high frequency cavity conductor attenuation by extending skin current path length and degrading unloaded quality factor.
Extracting In-Plane Dielectric Permittivity Values from Clamped Stripline Measurements
Clamped stripline measurements extract true in-plane dielectric permittivity when analytical models eliminate air gap capacitance errors.
Substrate Copper Surface Roughness Damping Effects on High Frequency Cavity Quality Factor Variations
Substrate copper roughness exceeding skin depth dampens cavity quality factor by extending surface current paths, demanding 3D surface area profiling and incoming batch screening.