
Extracting Substrate Temperature Dielectric Coefficients Using Split Post Resonators
Split post resonators extract substrate temperature dielectric coefficients by separating thermal expansion dimensional changes from intrinsic permittivity drift.

Split post resonators extract substrate temperature dielectric coefficients by separating thermal expansion dimensional changes from intrinsic permittivity drift.

Matrix thermal permittivity drift alters RF phase velocity and impedance, demanding ceramic-filled low-TcDk laminates for thermally stable millimeter-wave designs.

Substrate dielectric drift alters high-frequency signal phase velocity and impedance under thermal stress, requiring flat TCDk resin selection to hold timing margins.
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