Phase Resolved near Field Dipole Reconstruction for Multilayer Board Far Field Escape Prediction
Phase-resolved near-field dipole reconstruction predicts far-field escape emissions within 2 dB, eliminating un-phased scan errors before SAC testing.
Deriving Boundary Scan Diagnostic Coverage for High Density ASIC Arrays
Deriving boundary scan coverage for high-density ASIC arrays requires precise accounting of scannable versus un-scannable nets to prevent costly field escapes.
Correlating Multi Regime Escapes to Residual Bit Error Rates in PCI Express Channels
Unscreened high-frequency channel structural escapes drive PCI Express residual bit error rates above spec limits by inducing localized signal resonances.
Boundary Scan Interconnect Testing Essentials for Populated Circuit Board Assemblies
Boundary scan interconnect testing turns silicon multiplexers into virtual probes to verify fine-pitch BGA solder joints without physical test pads.