
Extracting Substrate Temperature Dielectric Coefficients Using Split Post Resonators
Split post resonators extract substrate temperature dielectric coefficients by separating thermal expansion dimensional changes from intrinsic permittivity drift.

Split post resonators extract substrate temperature dielectric coefficients by separating thermal expansion dimensional changes from intrinsic permittivity drift.

Split post cavity resonance measures in-plane substrate permittivity; z-axis core corrections prevent multi-ohm stripline impedance errors on woven glass panels.

Lead-free reflow shifts substrate permittivity by altering free volume and desorbing moisture, changing line impedance by up to 2.5 ohms on high-speed traces.
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