
Substrate Z-Axis Thermal Expansion Mechanics in High-Density Interconnect Laminates
Z-axis laminate expansion exceeding copper ductility during lead-free reflow drives microvia failure, requiring high-Tg filled dielectrics and coupon screening.

Z-axis laminate expansion exceeding copper ductility during lead-free reflow drives microvia failure, requiring high-Tg filled dielectrics and coupon screening.

Staging hydraulic lamination pressure and damping heating rates above dynamic viscosity minimums prevents hydrodynamic resin shear from displacing heavy copper inner conductors.
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